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Spot Low-Density Contaminants with Dual Energy Inspection
 
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Hard-to-spot contaminants can go undetected if you are not using the right detector technology for your application. DXD and DXD+ offer unparalleled detection for a broad range of applications.

Our new, free infographic illustrates the many capabilities of the X36 X-ray inspection system when integrated with our latest dual energy technologies. METTLER TOLEDO DXD and DXD+ technology can detect tiny contaminants such as fragments of bone, rubber, and glass, keeping your products safe and your process compliant.
 
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METTLER TOLEDO | 2915 Argentia Rd #6 | Mississauga, ON L5N 8G6 | 1-800-METTLER
 

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